Abstract
Abstract In the present study, silica-Zn2SiO4-Mn (silica-ZSiMn) glass-ceramics samples were synthesized via was elaborated by sol-gel route. The microstructure and electrical properties of glass-ceramics samples was investigated. The crystal structure and microstructure of glass-ceramics were studied by X-ray diffraction (XRD) and transmission electron microscope (TEM) techniques. XRD studies reveal the presence of Zn2SiO4 phases. Electrical studies show that as frequency increases, the conductivity decreases until a specific frequency (fmin) at which the conductivity starts to increase. However, the exponent ‘s’ decreases with temperature, which proves that the CBH (correlated barrier hopping) is the suitable process which assures the conduction. The ac activation energy decreases with the increase of frequency which is a normal physically explicable attitude. We believe that these findings provide the fundamental understanding about smart glass-ceramics materials for possible electronic applications.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
