Abstract
Dielectric CaCu3Ti4O12-xSnO2 ceramics (x = 0, 0.003, 0.006, 0.010, 0.015 and 0.020) have been synthesized by solid-state reaction method. The microstructure was studied by X-ray diffraction, Raman spectrum and Scanning electron microscope. It is revealed that SnO2-doping results in the distortion of crystal structure and various grain growths for CaCu3Ti4O12-based ceramics. Dielectric measurement shows that lower-doped samples (x = 0.003 and 0.006) exhibit enhanced dielectric constants which are over 70,776 and 26,406 at the range of 40-104 Hz, respectively. In addition, the dielectric properties are explained in terms of internal barrier layer capacitance model by using the impedance spectroscopy analysis.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
