Abstract
The microstructural changes during sintering of Ni-Zn ferrites used as the substrate for thin film magnetic recording heads have been studied by SEM, XRD and XPS. Any precipitates were not observed in the specimen air-sintered and furnace-cooled from 1423 K. ZnO precipitates, however, were observed at the grain boundaries, especially at the grain boundary triple points of the specimen furnace-cooled from 1453 K. While the above-mentioned ZnO precipitates were not observed on the specimen sintered in oxygen, the grain coarsening was observed in this case, with residual pores being trapped inside the grains. The existence of Ni 3+ ion was detected by XPS on the specimen prepared by HIP process, where the ratio of Ni 3+ /(Ni 2+ +Ni 3+ ) was confirmed to be about 3%...
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