Microstructural characterization of recrystallised Zircaloy-2 after pilgering using X-ray diffraction line profile analysis

Abstract

The paper deals with the characterization of microstructure of Zircaloy-2 specimens by X-ray Diffraction Line Profile Analysis (XRDLPA), collected at each stage of pilgering followed by annealing during fabrication. Different techniques of XRDLPA like Simplified Breadth Method, Williamson Hall Technique, Double Voigt Technique and Variance Method have been used to assess the microstructure at each stage. Microstructural parameters like average domain size, microstrain and dislocation density have been evaluated using these techniques. XRDLPA helps to characterize the globally averaged microstructure which can be used to monitor the fabrication process. Both double Voigt technique and variance method can be used as effective characterizing technique of microstructure during the process monitoring in real life production.