Microscopic characterization of function and structure within solid state lighting devices

Abstract

Microstructural investigations of solid state lighting devices are carried out by example of an LED filament. A workflow is presented combining X-ray computed tomography with light and electron microscopy. It allows a precise sample preparation which enables microscopic investigations of the inner structures within the device. Therefore the LED filament may still be electrically operated although a destructive preparation cannot be avoided. Optical functions and behavior are observed and correlated to material and structure on the microscale.