Abstract
Abstract New advances in the radiographic technique have been made using high intensity synchroton radiation as the X-ray source. A 100-fold improvement in the resolution of the technique was realized, and features on the order of micrometers in size can now be routinely observed using “microradiography”. The resolution which can be achieved and the factors influencing resolution and sensitivity are discussed. We have applied microradiography to a study of the development of creep damage in metals. Notched samples of copper were subjected to high temperature, slow strain rate tensile testing, and the resulting creep damage in these samples was recorded using microradiography. The density and distribution of creep damage was measured from the radiographs using an image analysis system. The results from the image analysis can be compared to damage predictions obtained from finite element models of the damage process to determine the applicability of these models.
Published Version
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