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Abstract
Discusses a microprocessor-controlled data acquisition system for automated acquisition of MOS transistor parameters. The Analog Signal Processor and the Control Interface Circuit are described. Finally, the authors explain the procedure of parameter determination based on the least squares estimation criterion. This procedure is applied to long-channel, surface-channel, enhancement-mode PMOS transistors. The <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">I</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">D</sub> - <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">V</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">D</sub> curves exhibit an accuracy of 1-3 percent compared with the experimental characteristics.
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