Abstract
Winding faults in power transformers usually grow insidiously and are difficult to detect. Such faults may progressively result in a complete transformer failure. Eventhough a recognised technique exists called Low Voltage Impulse method, there is a necessity to evolve other easier and more sensitive techniques. The Frequency Response Method is one such technique in use for some time but not fully established. The new “Inductance Signature” technique discussed in this paper appears to have some merits over the frequency response method. This paper describes the principle of Inductance Signature and a microprocessor based instrument designed on this principle.
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