Abstract

An advanced facility for characterization of highly radioactive materials by Imaging X-ray Photoelectron Spectroscopy (XPS) has been developed at the Chalk River Laboratories (CRL), based upon over a decade of prior experience with a prototype system. Auxiliary electron and ion guns provide additional in situ capabilities for scanning electron microscopy (SEM), scanning Auger microscopy (SAM) and composition depth profiling. The application of this facility to the characterization of irradiated fuel materials will be illustrated with selected results taken from a detailed study of the microchemistry at the fuel-sheath interface in a CANDU fuel element that was irradiated to extended burnup in the NRU (National Research Universal) reactor at CRL. Inside surfaces of the end caps and the welds between the sheath and the end caps as well as the thin-walled Zircaloy-4 sheath were analyzed. The in situ SEM capability was essential for selecting different areas on each sample, such as sheath locations with and without a visible retained CANLUB graphite layer, for XPS analysis. Effective infiltration of segregated fission products, especially cesium, into the graphite was demonstrated by depth profiling. A richer chemistry of segregated fission products was found on the end caps than on the sheath with elevated levels of barium, strontium, tellurium, iodine and cadmium as well as cesium. The results are consistent with current understanding of the primary migration route for fission products to the sheath and also indicate that the CANLUB layer functions as a chemical rather than a physical barrier to segregated fission products.

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