Abstract
We introduce a versatile method to control the quality factor Q of a conducting cantilever in an atomic force microscope (AFM) via capacitive coupling to the local environment. Using this method, Q may be reversibly tuned to within ∼10% of any desired value over several orders of magnitude. A point-mass oscillator model describes the measured effect. Our simple Q control module increases the AFM functionality by allowing greater control of parameters such as scan speed and force gradient sensitivity, which we demonstrate by topographic imaging of a VO2 thin film in high vacuum.
Highlights
We introduce a versatile method to control the quality factor Q of a conducting cantilever in an atomic force microscope (AFM) via capacitive coupling to the local environment
Our simple Q control module increases the AFM functionality by allowing greater control of parameters such as scan speed and force gradient sensitivity, which we demonstrate by topographic imaging of a VO2 thin film in high vacuum
The atomic force microscope (AFM)1 is a powerful tool for nanoscale imaging,2 manipulation,3,4 and fabrication
Summary
Magdalena, Adam Pivonka, Jeehoon Kim, Cun Ye, Martin A.
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