Abstract
Annealed laminates of YBa2Cu3Oy films on AgPd, SnO2 and Pt substrates were investigated by metallography, EPMA, and XDA. Thin homogeneous layers of Ba2SnO4 and BaZrO3 (in case of a ZrO2 diffusion barrier onto one side of AgPd) between ceramic and SnO2 or AgPd substrates were found. The adjacent interface is inhomogeneous and Y free for both substrates (for Pt two exist). The composition of their major phase could be shown to be a Ba2Cu3O5 type with Pd partitions instead for Cu (in case of ZrO2 contact), a YBa2Cu3Oy type without Y, but containing Pd (+ Ag) (in case of AgPd contact), Ba2SnO4 precipitates and BaCuO2, CuO particles are mixtures (SnO2 contact). Pt seems not to participate to any phase constituents; the two interfaces differ in the fine distribution of the phases concerned and therefore in the mean value of Ba, Cu, Pt concentrations.
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