Abstract
Nanostructured SnO2 thin films were prepared by carbothermal evaporation method. Morphological, structural and optical properties of the SnO2 thin films, before and after 8 MeV Si ion irradiation to fluences varying from 1 × 1013 to 1 × 1015 ions cm−2, were well characterized using atomic force microscopy (AFM), field emission scanning electron microscopy (FESEM), x-ray diffraction (XRD), Raman spectroscopy and photoluminescence spectroscopy (PL). XRD studies revealed the presence of SnO2 and Sn nanoparticles in the as-deposited samples. AFM and FESEM studies on the irradiated samples revealed formation of nanoring-like structures, at a fluence of 1 × 1015 ions cm−2, with a central hole and circular rim consisting of nearly monodisperse SnO2 nanoparticles. PL studies revealed strong enhancement in UV emissions upon 8 MeV Si ion irradiation. A growth mechanism underlying the formation of SnO2 nanorings involving self-assembly of SnO2 nanoparticles around nanoholes is tentatively proposed.
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