Abstract
A new test system has been developed that uses a vector network analyzer to make RF and microwave S-Parameter, power accuracy, power linearity, harmonic distortion, intermodulation distortion, phase noise and frequency accuracy measurements. The test system, which includes fixturing to allow connecting various devices under test, has been deployed into a manufacturing test environment. It was necessary to develop measurement uncertainties that account for the expected temperature range of the manufacturing environment, the impact of the fixturing and the expected uncertainties from the measuring equipment. Environmental and fixturing characterizations were determined by repeatedly calibrating the vector network analyzer over various environmental conditions and then analyzing the variability of the measured values when correcting for multiple calibrations. This paper discusses the test system design, the characterization of the fixturing, the effects of temperature and the test system calibration validation process.
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