Abstract
Abstract:A new test system has been developed that uses a vector network analyzer (VNA) to make RF and microwave S-Parameter, power accuracy, power linearity, harmonic distortion, intermodulation distortion, phase noise, and frequency accuracy measurements. The test system, which includes fixturing to allow connecting various devices under test (DUTs), has been deployed in a manufacturing test environment. Measurement uncertainties take into account the expected temperature range of the manufacturing environment, the impact of the fixturing, and the expected uncertainties from the measuring equipment. The environmental and fixturing characterizations were determined by repeatedly calibrating the vector network analyzer under various environmental conditions, and then analyzing the variability of the measured values when correcting for multiple calibrations. This paper discusses the test system design, the characterization of the fixturing, the effects of temperature, and the validation of the calibration ...
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
