Abstract

In this study, to obtain perpendicular magnetic tunnel junctions (p-MTJs) using half-metallic ferromagnets (HMFs), several methods were developed to induce perpendicular magnetic anisotropy (PMA) in full-Heusler Co2FeSi (CFS) alloy thin layers in an MTJ multilayer composed of a layered CFS/MgO/CFS structure. Oxygen exposure at 2.0 Pa for 10 min after deposition of the bottom CFS layer was effective for obtaining PMA in the CFS layer. One of the reasons for the PMA is the formation of nearly ideal CFS/MgO interfaces due to oxygen exposure before the deposition of the MgO layer. The annealing process was effective for obtaining PMA in the top CFS layer capped with a Pd layer. PMA was clearly observed in the top CFS layer of a Cr(40 nm)/Pd(50 nm)/bottom CFS(0.6 nm)/MgO(2.0 nm)/top CFS(0.6 nm)/ Pd(10 nm) multilayer, where the top CFS and Pd thin films were deposited at RT and subsequently annealed at 300°C. In addition to the continuous layer growth of the films, the crystalline orientation alignment at the top CFS/Pd interface probably attributes to the origin of PMA at the top CFS layer.

Highlights

  • Perpendicular-anisotropy magnetic tunnel junctions (p-MTJs)[1,2,3] have attracted considerable attention for their potential application in spin-transfer torque magnetoresistive random access memories (STT-MRAMs)

  • We developed perpendicularly magnetized CFS layers formed on MgO layers using several techniques, and we successfully fabricated p-MTJ structures with two perpendicularly magnetized CFS layers

  • perpendicular magnetic anisotropy (PMA) was clearly observed for the sample that underwent oxygen exposure

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Summary

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Perpendicular magnetization of full-Heusler alloy films induced by MgO interface.

INTRODUCTION
EXPERIMENTAL METHODS
RESULTS AND DISCUSSION
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