Abstract
Abstract The paper presents the implementation of diffraction and spectral analysis methods allowing 1 μm resolution enhancement of optical instruments intended for measurements of such round wire materials as cables, wires, cords, etc. with diameters exceeding the wavelength (~0.5 mm and large). The transformation function suggested allows detecting geometrical boundaries of object׳s shadows that are used to calculate its diameter independently from its location in the gaging zone. The real-time detection algorithm is described for diffraction extreme values in the analog video signal produced by the charge-coupled device sensors. A method of additional improvement of resolution is shown on the basis of spectral analysis.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call