Metasurface‐Based Mueller Matrix Microscope

Abstract

AbstractIn conventional optical microscopes, image contrast of objects mainly results from the differences in light intensity and/or color. Muller matrix optical microscopes (MMMs), on the other hand, can provide significantly enhanced image contrast and rich information about objects by analyzing their interactions with polarized light. However, state‐of‐the‐art MMMs are fundamentally limited by bulky and slow polarization state generators and analyzers. Here, the study demonstrates a metasurface‐based MMM, i.e., Meta‐MMM, which is equipped with a chip‐integrated, single‐shot metasurface polarization state analyzer (Meta‐PSA). The Meta‐MMM is featured with high‐speed measurement (≈2s per Muller matrix (MM) image), superior operation stability, dual‐color operation, and high measurement accuracy (measurement error 1–2%) for MM imaging. The Meta‐MMM is applied to nanostructure characterization, surface morphology analysis, and discovering birefringent structures in honeybee wings. The Meta‐MMMs hold the promise to revolutionize various applications from biological imaging, medical diagnosis, and material characterization to industry inspection and space exploration.