Abstract
In this paper, an analytical and numerical study of a new type of electromagnetic absorber, operating in the infrared and optical regime, is proposed. Absorption is obtained by exploiting Epsilon-Near-Zero materials. The structure electromagnetic properties are analytically described by using a new closed-form formula. In this way, it is possible to correlate the electromagnetic absorption properties of the structure with its geometrical characteristics. Good agreement between analytical and numerical results was achieved. Moreover, an absorption in a wide angle range (0°-80°), for different resonant frequencies (multi-band) with a large frequency bandwidth (wideband) for small structure thicknesses (d = λp/4) is obtained.
Highlights
IntroductionThere has been an increasing interest in the area of electromagnetic wave absorbers
In recent years, there has been an increasing interest in the area of electromagnetic wave absorbers
It is difficult to control the specific absorption properties, due to the fact that it is not easy to find materials naturally impedance matched to free space
Summary
There has been an increasing interest in the area of electromagnetic wave absorbers. Different kinds of absorbers have been implemented: the Salisbury screen, the Jaumann absorber [3], the Dallenbach layer [5], the crossed grating absorbers [6] and the circuit analog ones [7]. Despite such a plethora of devices, several issues are still present. The thickness: most of the above mentioned solutions require the thickness to be at least λ/4, where λ is the free-space wavelength at the resonant frequency. The restricted operative frequency range: the aforementioned electromagnetic wave absorbers are typically developed in the microwave regime
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