Abstract
Aiming at the problems of inefficient detection caused by traditional manual inspection and unclear features in metal surface defect detection, an improved metal surface defect detection technology based on the You Only Look Once (YOLO) model is presented. The shallow features of the 11th layer in the Darknet-53 are combined with the deep features of the neural network to generate a new scale feature layer using the basis of the network structure of YOLOv3. Its goal is to extract more features of small defects. Furthermore, then, K-Means++ is used to reduce the sensitivity to the initial cluster center when analyzing the size information of the anchor box. The optimal anchor box is selected to make the positioning more accurate. The performance of the modified metal surface defect detection technology is compared with other detection methods on the Tianchi dataset. The results show that the average detection accuracy of the modified YOLO model is 75.1%, which ia higher than that of YOLOv3. Furthermore, it also has a great detection speed advantage, compared with faster region-based convolutional neural network (Faster R-CNN) and other detection algorithms. The improved YOLO model can make the highly accurate location information of the small defect target and has strong real-time performance.
Highlights
As one of the main raw materials of industrial products, metal will inevitably be damaged on its surface during processing, such as scratches and deformations
The quality of images has a significant impact on the effect of detection
The model of equipment used in this system is determined
Summary
As one of the main raw materials of industrial products, metal will inevitably be damaged on its surface during processing, such as scratches and deformations. How to conduct efficient and accurate detection of metal surface defects is one of the key research directions in target detection. It only needs to select the appropriate camera and light source to collect the surface images of the metal, and uses the related defect detection algorithm to locate and classify the defects. This method has high detection efficiency and can greatly improve the level of the manufacturing industry [1]
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