Abstract
We present a method for the measurement of the noise of microwave amplifiers operating at the single photon level. It is based on the shot noise produced by a nanowire resistor in the hot electron regime. This noise source is simply controlled by a dc current and offers the advantage of being self-calibrating. After testing the noise source with a cryogenic high electron mobility transistor amplifier, we demonstrate its usefulness by calibrating a Josephson parametric amplifier operating near the quantum limit.
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