Abstract

Molecular dynamics computer simulations are employed to investigate processes leading to particle ejection from free-standing two-layered graphene irradiated by keV argon gas cluster projectiles. The effect of the primary kinetic energy and the projectile size on the ejection process is investigated. It has been found that both these parameters have a pronounced influence on the emission of particles. The interaction between argon projectiles and graphene is strong regardless of graphene's minimal thickness. A significant portion of the primary kinetic energy is deposited into the sample. Part of this energy is used for particle emission, which is substantial. As a result, circular nanopores of various dimensions are created depending on the bombardment conditions. A major part of the deposited energy is also dispersed in a form of acoustic waves. Different mechanisms leading to particle ejection and defect formation are identified depending on the projectile energy per atom. The implications of the results to a novel analytical approach in Secondary Ion Mass Spectrometry based on ultrathin free-standing graphene substrates and a transmission geometry are discussed.

Highlights

  • Two-dimensional crystals have been a subject of extensive studies for some time due to their unique properties [1]

  • Kim et al considered the cleaning of suspended graphene with argon clusters [6], while few others worked on the subject of using these projectiles for cleaning of graphene supported on the surface [7,8,9,10]

  • We presented the results of computer simulations investigating the bombardment of two-layered free-standing graphene by argon cluster projectiles with various kinetic energy and size

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Summary

Introduction

Two-dimensional crystals have been a subject of extensive studies for some time due to their unique properties [1]. Two of the less apparent forms of using the ion beam are cleaning the graphene surface from contaminations and uplifting of deposited material for further chemical analysis. Verkhoturov et al proposed to use free-standing graphene as a substrate for chemical analysis by Secondary Ion Mass Spectrometry (SIMS). In this approach, a so-called “transmission geometry” is used in which the analysed organic material is deposited on one side of the ultrathin substrate, while another side is bombarded by cluster projectiles [11,12]. It is argued that such geometry can be attractive for the analysis of ultra-small amounts of organic material, molecular nano-objects, and supramolecular assemblies [11,12]

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