Abstract

The mechanisms for the usually very strong background signal in optically detected magnetic resonance (ODMR) experiments have been studied in high-purity epitaxial GaAs layers. The optically excited carriers are heated by the microwave field, via both cyclotron resonance and other microwave absorption processes involving free-carrier transitions within a Landau subband. The main mechanism for the change of photoluminescence (PL) by the hot carriers in the temperature range 4-10 K studied in this work is concluded to be impact ionization of shallow bound excitons (BE's) and shallow donors by hot free carriers, resulting in a quenching of the shallow PL emissions related to BE's and donor-acceptor pairs. These processes explain the microwave-induced change of PL intensity (the ODMR background signal).

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