Abstract

Nanostructured copper/amorphous hydrogenated carbon (a-C:H) composite films approximately 500 nm in thickness have been deposited on silicon substrates by an hybrid technique combining a microwave plasma-enhanced chemical vapor deposition (PECVD) process with a sputter-deposition process from argon–acetylene mixtures and copper target. In these films, the a-C:H phase would act as a tough matrix while reinforcing nanocrystallites of copper are imbedded in the amorphous matrix. The mechanical behavior of nanocomposite films under point loading conditions was studied by nanoindentation using a Berkovich indenter. The transition from deposition of soft polymer-like to ion-hardened polymer-like a-C:H films was observed with increasing concentration of acetylene in the gas phase. The hardness of the Cu/a-C:H composite films is higher by a factor of two than that of pure a-C:H films deposited under similar conditions. The increase in hardness is probably related to the strengthening effect of copper nanocrystallites dispersed in the amorphous carbon matrix.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call