Mechanical fatigue test method for chip/underfill delamination in flip-chip packages

Abstract

Underfill resin between Si chips and printed circuit boards is useful for improving the reliability of flip-chip packages. Generally, thermal cycle tests (TCTs) are applied to electronic packages under development in order to prove their reliability. At the early stage of development, however, a more effective test method is desirable, because TCTs are time-consuming. A new mechanical fatigue test for the underfill resin in flip-chip packages, namely the four points support test method, is proposed in this paper. The validity of the mechanical test method could be verified from the results of stress analyses and experiments. Considering the chip/underfill delamination statistically based on the assumption of Markov process, it was shown that the delamination probability during cyclic loads could be estimated with equations of the displacement range and number of cycles.