Measuring the complex admittance of a nearly isolated graphene quantum dot

Abstract

We measured the radio-frequency reflection spectrum of an on-chip reflection line resonator coupled to a graphene double quantum dot (DQD), which was etched almost isolated from the reservoir and reached the low tunnel rate region. The charge stability diagram of DQD was investigated via dispersive phase and magnitude shift of the resonator with a high quality factor. Its complex admittance and low tunnel rate to the reservoir was also determined from the reflected signal of the on-chip resonator. Our method may provide a non-invasive and sensitive way of charge state readout in isolated quantum dots.