Abstract
The soft-nanotechnology that treats softmatter in nanometer scale needs to develop proper and original techniques for analyzing and handling the softmatter. The surface analysis of solids under vacuum condition has made remarkable progress. However, softmatter samples in vacuum atmosphere change their original properties, and are easily damaged by high energy probe beams. Thus, it is not suitable to observe “raw state” of the softmatter samples by the conventional surface analysis techniques. Scanning probe microscopy (SPM) such as atomic force microscopy (AFM) can analyze softmatter samples in moderate condition in air and water. Optical probe technique such as infrared absorption spectroscopy (IRAS) is also nondestructive method to analyze the softmatter samples. Scanning near-filed optical microscopy (SNOM), combined SPM and optical spectroscopy, enables the simultaneous measurements of topography and optical information. Here, we briefly introduce outlines of AFM, MIR-IRAS (Multiple internal reflection IRAS), and SNOM and examples of their applications.
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