Abstract
We developed a single-shot X-ray spectrometer for wide-range high-resolution measurements of Self-Amplified Spontaneous Emission (SASE) X-ray Free Electron Laser (XFEL) pulses. The spectrometer consists of a multi-layer elliptical mirror for producing a large divergence of 22 mrad around 9070 eV and a silicon (553) analyzer crystal. We achieved a wide energy range of 55 eV with a fine spectral resolution of 80 meV, which enabled the observation of a whole SASE-XFEL spectrum with fully-resolved spike structures. We found that a SASE-XFEL pulse has around 60 longitudinal modes with a pulse duration of 7.7 ± 1.1 fs.
Highlights
X-ray Free Electron Lasers (XFELs), such as the Linac Coherent Light Source (LCLS) [1]and the SPring-8 Angstrom Compact Free Electron Laser (SACLA) [2], have successfully generated brilliant, femtosecond X-ray pulses, achieving an ultrahigh resolving power in both space and time that opens up new frontiers in various scientific fields [3,4,5]
Our experiment was conducted at BL3 of SACLA [15]
XFEL pulses with a central photon energy of 9070 eV were focused with the two3.shown
Summary
X-ray Free Electron Lasers (XFELs), such as the Linac Coherent Light Source (LCLS) [1]. The SPring-8 Angstrom Compact Free Electron Laser (SACLA) [2], have successfully generated brilliant, femtosecond X-ray pulses, achieving an ultrahigh resolving power in both space and time that opens up new frontiers in various scientific fields [3,4,5]. SASE-XFEL pulses have many narrow spike structures originating from the stochastic nature of the electron beam used as light source. It was difficult to fully resolve the spike structure with a typical width of ~100 meV over the entire pulse spectrum covering a few tens of eV. We report on the development of a single-shot spectrometer covering the whole XFEL spectrum with fully-resolved spike structures
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