Abstract
A simple procedure is developed for the measurement of the differential quadratic electrooptic coefficient, R 33, by two-beam polarization (TBP) interferometery. It is shown that a TBP interferometer can be used for measuring the Kerr coefficient of a thin film with a strong Fabry–Perot effect. The measured values of the differential effective Kerr coefficient, R 33, of lead zirconate titanate 52/48 thin film lies inside the interval between −0.5×10 −18 m 2/V 2 and +1.7×10 −18 m 2/V 2 for the external DC field from −160 kV/cm to 160 kV/cm, in agreement with the known data. The correlation between differential and commonly used electrooptic coefficients is discussed.
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