&lt;title&gt;Measurement of the quadratic electro-optic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer&lt;/title&gt;

Vasilii V Spirin,Serguei V Miridonov,Kwangsoo No,Mikhail G Shlyagin

doi:10.1117/12.349722

<title>Measurement of the quadratic electro-optic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer</title>

Vasilii V Spirin, Serguei V Miridonov + Show 2 more

https://doi.org/10.1117/12.349722

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Publication Date: May 31, 1999

Affiliation: Center for Scientific Research and Higher Education at Ensenada, Korea Advanced Institute of Science and Technology

#Measurement Of Electro-optic Coefficient #Lead Zirconate Titanate Thin Film + Show 8 more

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Abstract

A simple procedure is developed for the measurement of the differential quadratic electro-optic coefficient, R33, by two-beam polarization (TBP) interferometry. It is shown that a TBP interferometer can be used for measuring the Kerr coefficient of a thin film with a strong Fabry-Perot effect. The measured values of the differential effective Kerr coefficient, R33 of lead zirconate titanate 52/48 thin film lie inside the interval between -0.5 * 10-18 m2/V2 and +1.7 * 10-18 m2/V2 for the external DC field from -160 kV/cm to 160 kV/cm, in agreement with the known data. The correlation between differential electro-optic coefficients and field-induced birefringence is discussed.

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