Measurement of the Parameters of Multiple Sinusoids Based on Binary Data

Abstract

This article introduces a novel procedure for quick estimation of the parameters of a sum of sinusoidal signals based on 1-bit measurements. Amplitude, phases, and frequencies of the signal components are assumed unknown, as well as the threshold level of the comparator used to produce measurement results. To provide enough information at the 1-bit quantizer input, a sinewave is assumed to dither one of the two comparator's inputs. To ease the procedure's application, only the peak-to-peak amplitude of this dither signal is assumed known. Theoretical, simulation-based and experimental results validate the presented approach.