Abstract
X-ray photoelectron spectroscopy (XPS) and high resolution transmission electron microscopy (TEM) with high annular dark-field (HAADF) microscopy have been used to characterize the nanoscale oxide film formed naturally on the surface of cold-rolled sheet of mild steel. Main aim of this research was to confirm that XPS could be used in determining the thickness of thin oxide film as a substitute for the laborious TEM analysis. The preparation and analysis technique for the XPS depth profiling has been investigated to characterize the oxide film. The selection of appropriate sputter rate and sputter area according to sheet material components and the exact estimation of sputter depth from sputter rate during depth profiling were essential for the determination of the nanoscale oxide thickness.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
