Abstract
This work discusses the development of an analysis routine for evaluating the nanoparticle distribution in nanocomposite thin films. YBa2Cu3O7−δ (YBCO) nanocomposite films were synthesized via a chemical solution deposition approach starting from colloidal YBCO solutions with preformed nanoparticles. The distribution of the nanoparticles and interlayer diffusion are evaluated with X-ray photoelectron spectroscopy (XPS) depth profiling and compared with cross-sectional transmission electron microscopy (TEM) images. It is shown that the combination of both techniques deliver valuable information on the film properties as nanoparticle distribution, film thickness and interlayer diffusion.
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