Measurement of the Microwave Refractive Index of Materials Based on Parallel Plate Waveguides

Abstract

An electrical field scanning apparatus based on a parallel plate waveguide method is constructed, which collects the amplitude and phase matrices as a function of the relative position. On the basis of such data, a method for calculating the refractive index of the measured wedge samples is proposed in this paper. The measurement and calculation results of different PTFE samples reveal that the refractive index measured by the apparatus is substantially consistent with the refractive index inferred with the permittivity of the sample. The proposed refractive index calculation method proposed in this paper is a competitive method for the characterization of the refractive index of materials with positive refractive index. Since the apparatus and method can be used to measure and calculate arbitrary direction of the microwave propagation, it is believed that both of them can be applied to the negative refractive index materials, such as metamaterials or “left-handed” materials.