Measurement of the hall mobility of injected electrons in liquid tetramethylsilane between 22 and 164 °C

Abstract

We have measured the Hall mobility of excess electrons in liquid tetramethylsilane (TMS) between room temperature and 164°C. The novel result is that, within an experimental error of ≈10%, the Hall mobility μ h is equal to the drift mobility μ d ; μ h = 101 ± 7 cm 2/V s at 22°C and 53 ± 5 cm 2/Vs at 164°C. This indicates that, contrary to what is observed in neopentane, traps are unimportant and, in particular, are not responsible for the mobility drop observed close to the critical point in TMS.