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https://doi.org/10.1063/1.113044
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Cite Journal: Applied Physics Letters |  Publication Date: Oct 3, 1994 |
 Citations: 38 |
A nanosecond time resolution pyrometer has been developed for measuring the transient temperature of thin polycrystalline silicon (p-Si) films irradiated by a pulsed excimer laser. The sample design structure and material optical properties allow direct measurement of the temperature at the solid–liquid phase change interface.
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