Abstract
ABSTRACTAn energy-variable synchrotron diffraction technique is established as a novel method for depth-resolved measurements of d-spacings and residual strains in polycrystalline structures. The depth sensitivity is achieved by the controlled changing the x-ray energy and, hence, the x-ray penetration into the sample. Quasi-parallel synchrotron radiation being diffracted at different depths deviates differently from the detector axis. As a result, the maximum diffraction intensity recorded in the detector is coming from a certain depth, which is energy dependent. This finding opens a way for strain measurements with high depth resolution by changing the x-ray energy in small enough steps. The developed technique is applied to characterize the electrodeposited Cu/Ni multilayers.
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