Abstract
Knowledge of beam fluence has a crucial role in quantitative particle‐induced X‐ray emission analysis. In some situations, a direct measurement of the beam charge on the target is either impossible or impractical. In such cases, indirect determination of the beam fluence can utilise the characteristic X‐ray of argon or other gases, which was being kept at a stable low partial pressure in the vicinity of the analysed sample. As the X‐ray signal of argon depends on the total charge, it can be used to quantify the charge. This paper describes the experimental design, the hardware and software modules that we created, the validation of the method, the application of the method during elemental analyses of fragile philatelic samples with overprints, and the lessons learned. Copyright © 2012 John Wiley & Sons, Ltd.
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