Abstract
The values of the superconducting penetration depth (s.p.d.) measured on “thin” (255 nm) and “thick” (700 nm) niobium films are presented. The obtained values of s.p.d. in our experiments at T=4.9 K are 145(+/−15) nm for a “thin” film, and 90(+/−10) nm for a “thick” film. It is essentially different from that one for bulk niobium (43 nm at T=4.6 K after G.P. Felcher et al., Phys.Rev.Lett. 52, 1539 (1984)). The experiment has been carried out on the polarized neutron spectrometer at the IBR-2 reactor in Dubna.
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