Abstract
High sensitivity microwave measurements of the in-plane magnetic penetration depth in c-axis oriented YBa 2Cu 3O 7−δ (YBCO) and Nd 1.85Ce 0.15CuO 4−δ (NCCO) thin films are reported. In the low temperature region, for the NCCO samples λ(T) follows the expected exponential behavior, while for the YBCO compound the data show a clear quadratic temperature dependence.
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