Abstract
The new developed “sweeping detector” techniques using high energy synchrotron radiation allow to measure textures and microstructures of materials and their change during heat treatment with high location and orientation resolution. Here we show these new methods applied to cold rolled and subsequently annealed nickel samples. The grain-resolved measurements show, impressively, many details of the recrystallization process which can otherwise not be seen. The results of these measurements can be the base for omprehensive recrystallization theories.
Full Text
Submitted Version (
Free)
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call