Measurement of electron energy band structure in the valence band of MgO thin film with and without a sprayed functional layer by secondary electron emission from Auger neutralization

Abstract

We have investigated the electron energy band structure of MgO thin film with and without a sprayed functional layer (FL), based on the Auger neutralization theory by a gamma-focused ion beam (γ-FIB) system. We have measured the secondary electron emission characteristics of MgO thin film with and without the sprayed FL, and from which their respective energy band structure f e (α) functions have also been investigated by using an He ion beam with ionization energy 24.58 eV through Fast Fourier Transform (FFT) and inverse-Fast Fourier Transform (IFFT).