Measurement of Crystallite Size of Method and Evaluation of Crystal Defects

Abstract

The size of crystallites in mono-dispersed cubic silver bromide grains was measured by applying a powder X-ray diffraction method and Scherrer's equation to grains that were suspended in swollen gelatin layers. In order to evaluate the existence of defects, the measured crystallite size was compared to those measured by using a scanning electron microscope. In the case of the grains prepared by the controlled double jet method, the size of crystallites was equal to the edge length of the grains that had edge lengths smaller than 400 nm. This result proved the usefulness of the above-stated method for measuring the size of crystallites and also evaluating the presence of any crystal defect in each grain. In the case of the grains, which were precipitated in the presence of a sensitizing dye and potassium iodide, the size of crystallites was smaller than the edge's length, indicating the discontinuities in the grains introduced during the precipitation process.