Abstract
Measurement error in prism coupling method is studied and an analytic expression for the uncertainty of mode effective index measurement in an ion exchanged surface waveguide is derived. A novel algorithm to determine the profile of refractive index for ion-exchange waveguides is proposed. This method takes the values calculated by anti-WKB and linear segment interpolation as approximation and then uses the least squares fitting to eliminate the measurement error. Numerical results show that the proposed algorithm can effectively reconstruct the transverse refractive index profile of graded ion-exchange planar waveguides.
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