Abstract
In this work, a new inverse method for the reconstruction of refractive index profiles of the single-mode ion-exchanged planar and channel waveguides from the intensity profiles of the fundamental mode, as measured with near-field (NF) technique, is presented. In the numerical process, a finite-difference method is used to discretize the governing equation and then a linear inverse model is constructed to identify the unknown profiles of refractive index. The present approach is to rearrange the matrix form of the scalar wave equation and then the linear least-squares error method is adopted to find the solutions. The results show that the accuracy of index determination can be accessed even when the measured noise is considered. In comparison with the traditional approach, the advantages of this method are that no prior information is needed on the functional form of the unknown index profiles, no initial guesses are required, no iterations in the calculating process are necessary, and the inverse problem can be solved in a linear domain.
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