Abstract
In this study, the liquid film thickness of swirling annular flow has been measured by parallel conductivity probes. The differences of the liquid film between vertically downward swirling annular flow and straight flow have been investigated. A theoretical model for predicting the liquid film thickness in the swirling annular flow without decaying has been developed. The predicted liquid film thickness of 93.2% data points is within ±10% relative error band. The results prove that the model proposed in this study has satisfactory accuracy.
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