Abstract
The change in surface conductance due to the metallic field effect has been calculated for various simple thin film models which take into account that the penetration depth of applied fields in metals is very small, and that mean-free-path effects are important in the very thin films in which the field effect is observable. Comparison with experiment of the behavior to be expected due to effective changes in surface scattering, surface charge density, or film thickness shows that the latter mechanism seems to be predominant. Predictions of this model regarding the magnitude of the field effect are given.
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