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https://doi.org/10.1049/el:19680076
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Cite Journal: Electronics Letters |  Publication Date: Mar 22, 1968 |
Affiliation: University of Salford
Detectors for noise measurements at low frequencies need to be capable of integrating over long periods and should also be immune from drifts of datum level. A circuit satisfying these requirements is described and its performance is quoted. The technique employs a combination of integration and a multilevel transit counting circuit.
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