Abstract
We report studies on the role of a ZnTe buffer in determining the crystalline phase of MBE-grown MnSe1−xTex alloy thin films. It was found that MBE growth of MnSe and MnTe directly onto a zincblende GaAs substrate usually result in their corresponding stable phases, which are rocksalt and hexagonal, respectively. A set of zincblende MnSe1−xTex alloy thin films with Te composition covering from 0.27 to 1 were fabricated on zincblende ZnTe buffer layers. We have addressed the lattice distortion issue due to thin film effect for these films. A combination of several structural characterizations demonstrates that a perfect lattice matched MnSe1−xTex/ZnTe heterostructure can indeed be realized. The results of this study pave the way for realizing a double-barrier MnSe1−xTex/ZnTe/MnSe1−xTex resonant tunneling diode structure with perfect lattice match as a candidate for a promising THz emitter.
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