Matrix Formulation of the Schuster-kubelka-Munk Theory of Diffuse Scattering. 1. The Characteristic Matrix and General Properties of Diffusing Layers

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It is shown that, under the usual assumptions of the Schuster-Kubelka-Munk theory, diffusing layers may be represented by 2 by 2 matrices. In particular, a single layer may be completely characterized by a ‘characteristic matrix’ whose elements are directly related to the reflectance and the transmittance of the layer. Experimental methods for determining the elements of the characteristic matrices are suggested and a few general theorems dealing with the properties of such layers are given. A general conclusion is that, in spite of basic differences between scattering layers and thin film multi-layers as regards their structure as well as the physical assumptions under which they are studied, there is much in common in their properties.