Abstract
This special issue of the Ukrainian Metrology Journal is dedicated to the the XII International Scientific and Technical Conference METROLOGY AND MEASURING TECHNIQUES (METROLOGY-2020). It presents theses of reports on the Reproduction and distribution of SI units, Fundamental metrology and traceability, Results of international comparisons, Standards and measuring systems, Sensors, Sensors and Intelligent Systems Technologies, Industry 4.0 and additive technology, Computer modeling for metrology needs, Metrology to improve the efficiency and reliability of energy systems and networks, New documents and standards in metrology, legal metrology. International Scientific and Technical Seminar Uncertainty of Measurements: Scientific, Applied, Regulatory and Methodological Aspects (UM-2020) was held within the framework of the conference.
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